An approach to nano-chemical analysis through NC-AFM technique
نویسندگان
چکیده
منابع مشابه
Noise in NC-AFM measurements with significant tip–sample interaction
The frequency shift noise in non-contact atomic force microscopy (NC-AFM) imaging and spectroscopy consists of thermal noise and detection system noise with an additional contribution from amplitude noise if there are significant tip-sample interactions. The total noise power spectral density DΔf (fm) is, however, not just the sum of these noise contributions. Instead its magnitude and spectral...
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Manabu Tokeshi 1,2,3,4,* and Kiichi Sato 5 1 Division of Applied Chemistry, Faculty of Engineering, Hokkaido University, Kita 13 Nishi 8, Kita-ku, Sapporo 060-8628, Japan 2 ImPACT Research Center for Advanced Nanobiodevices, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan 3 Innovative Research Center for Preventive Medical Engineering, Nagoya University, Furo-cho, Chikusa-ku, Na...
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ژورنال
عنوان ژورنال: Catalysis Today
سال: 2006
ISSN: 0920-5861
DOI: 10.1016/j.cattod.2006.05.008